会议名称(中文)：  2014年SPIE纳米成像和纳米光谱学会议 
会议名称(英文)：  Nanoimaging and Nanospectroscopy II 
所属学科：  光学,纳米科学与技术  
开始日期：  2014-08-17 
结束日期：  2014-08-21 
所在国家：  美国 
所在城市：  美国 
具体地点：  San Diego, California, United States 
主办单位：  国际光学和光子学学会 

[ 会务组联系方式 ]   
联系电话：  +1 360 685 5600 
E-MAIL：  saral@spie.org 
  
会议网站：  http://spie.org/OPN/conferencedetails/nanoimaging-nanospectroscopy  
会议背景介绍：  There is a huge demand for research tools allowing one to “see” nanostructures and to characterize and understand materials as well as biochemical process at nanoscale resolution. Optical techniques such as imaging and spectroscopy at nanoscale make this possible. Optical imaging with spatial resolution far beyond the diffraction limits of light together with spectroscopic studies with highly localized optical fields have pushed the limits of spatial resolution and sensitivity to new scales. Continuous improvements open ways to novel applications at the forefront of scientific knowledge.

The purpose of this interdisciplinary conference is to encompass all aspects of nano-imaging and nano-spectroscopy, including theory and novel concepts, experimental demonstration of novel concepts, major developmental progress and applications to any field in science, in particular, biology, medicine, and the material sciences.

征文范围及要求：  Papers are solicited in (but not restricted to) the following areas:

Far-field super-resolution imaging/nanoimaging techniques, such as:
stimulated emission depletion (STED) microscopy
photoactivated localization microscopy (PALM)
stochastic optical reconstruction microscopy (STORM)
direct stochastic optical reconstruction microscopy (dSTORM)
structured illumination microscopy (SIM)
ground state depletion-individual molecule return (GSDIM) microscopy
reversible saturable optical fluorescence transitions (RESOLFT) microscopy.

Near-field super-resolution imaging/nanoimaging techniques, such as:
near-field scanning optical microscopy (NSOM/SNOM)
tip-enhanced Raman scattering (TERS) microscopy
tip-enhanced photoluminescence (TE-PL) microscopy
tip-enhanced coherent anti-Stokes Raman scattering (TE-CARS) microscopy.

Other super resolution optical imaging techniques, such as:
saturated excitation (SAX) microscopy
other nonlinear optical microscopy.

Nano-spectroscopic techniques, such as:
surface-enhanced Raman spectroscopy (SERS)
surface-enhanced infrared absorption spectroscopy (SEIRAS)
shell-isolated nanoparticle-enhanced Raman spectroscopy (SHINERS)
stimulated Raman spectroscopy (SRS).