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会议名称(中文)：2014年SPIE红外传感器设备和应用研讨会
会议名称(英文)：Infrared Sensors, Devices, and Applications IV
所属学科：光学, 光电子学
开始日期：2014-08-17
结束日期：2014-08-21
所在国家：美国
所在城市：美国
具体地点：San Diego, California
主办单位：国际光学和光子学学会
协办单位：
承办单位：
议题：
[ 组织结构 ]
会议主席：
组织委员会主席：
程序委员会主席：
会议嘉宾：
姓名 职务 简介 演讲题目
[ 重要日期 ]
摘要截稿日期： 2014-02-03
[ 会务组联系方式 ]
联系人：
联系电话： +1 360 685 5600
传真：
E-MAIL： saral@spie.org
通讯地址：
邮政编码：
会议注册费：
会议网站： http://spie.org/OPO/conferencedetails/infrared-sensors-devices-applications
会议背景介绍：
The detection of infrared radiation has proven to be a viable investigative tool in environmental studies, homeland security, and in medical, automotive, and military applications. This conference will provide a venue for papers ranging from basic device physics to novel applications. There will be sessions featuring image processing techniques on the focal plane and smart readout electronics. Rapid development in feature size has led to the need for continual state-of-the-art updates to the optics community. Recent developments in strained superlattices, type II antimony-based detector materials, InAs:GaAs, and developments in room temperature infrared detectors have resulted in significant material advances. Various architectures using signal conditioning technology have been demonstrated at cryogenic temperatures for higher-performance cooled IR FPAs, and are therefore available as tools for researchers in various disciplines. We are looking for papers that demonstrate state-of-the-art in novel readout structures, on-chip signal processing, and papers that will provide information on newly designed, less expensive digital circuits for fast and ultrafast signal processors on the focal plane array.
In addition, the conference is intended as a high-level forum bringing together scientists and engineers involved in the research, design, and development of infrared sensors and unique IR device structures including nanotechnology.
征文范围及要求：
Papers are solicited for, but not limited to, the following topics:
SWIR, MWIR, LWIR, and VLWIR detectors
nanotechnology-based EO/IR detectors
nano-/microbolometers
HgCdTe (MCT) technology
MBE growth of HgCdTe on low-cost, large-format Si substratesstrained-layer-superlattice technology
higher-operating-temperature detectors
avalanche photodiodes
electronic readout image intensifier devices
innovative low-noise readout circuits, including cryogenic electronics & on-chip S/H
infrared detector materials (i.e., InSb, HgCdTe, GaAs)
smart focal planes
diffractive optics on FPA
FPA signal and data processing, both on- and off-chip
advanced microchannel plates
advanced fiber optics for sensing
cameras for low-light-level high-definition TV
photon-counting imaging
lidar and ladar imaging
image intensifiers for military night vision systems
plasmonic IR applications
robotic vision
unmanned autonomous vehicle cameras
undersea imaging
multispectral systems
commercial applications
space-based sensing applications
astronomical applications
industrial applications
automotive applications
medical applications
imaging spectrometer applications
imaging polarimeter applications. |
