会议名称(中文):第九届国际精密工程测量和仪器仪表研讨会 会议名称(英文):9th International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI) 所属学科:光学,光电子学 开始日期:2014-08-08 结束日期:2014-08-11 所在国家:中华人民共和国 所在城市:湖南省 张家界市 具体地点: 主办单位:International Committee on Measurements and Instrumentation (ICMI) National Natural Science Foundation of China (NSFC) Chinese Society for Measurement (CSM) China Instrument Society (CIS) 协办单位: 承办单位: International Committee on Measurements and Instrumentation (ICMI) Instrumentation Committee of CSM (IC-CSM) Harbin Institute of Technology (HIT) 议题:
[ 组织结构 ] 会议主席: 组织委员会主席: 程序委员会主席: 会议嘉宾: 姓名 职务 简介 演讲题目
[ 重要日期 ] 摘要截稿日期:2014-04-01 全文截稿日期:2014-06-15 [ 会务组联系方式 ] 联系人: 联系电话:+86-451-86402258 传真: +86-451-86402258 E-MAIL:ispemi2014@hotmail.com 通讯地址: 邮政编码: 会议注册费: 会议网站:http://www.ispemi.org/ 会议背景介绍: International Symposium on Precision Engineering Measurements and Instrumentation (ISPEMI) is an international symposium held every other year in different cities of China with English as its working language since 1999. ISPEMI 2014 is the 9th ISPEMI. It is sponsored by International Committee on Measurements and Instrumentation (ICMI), National Natural Science Foundation of China (NSFC), Chinese Society for Measurement (CSM), and China Instrument Society (CIS), and organized by Harbin Institute of Technology (HIT), together with SPIE, National University of Defense Technology, Beijing Information Science and Technology University and Hefei University of Technology. The purpose of ISPEMI 2014 is to bring together young and senior researchers and engineers working in the field of precision engineering measurements and instrumentation both inside and outside China, and provide an international technical forum for them to present their researches and develop their knowledge of the recent advances on this particular aspect. 征文范围及要求: Oral and post sessions are planned for ISPEMI 2014 in the following subject areas 1. Instrumentation Theory and Methodology 2. Measurement for Precision and Ultra-Precision Machining 3. Novel Instrument and Measurement System 4. Modern Optics and Instruments for Precision Measurement 5. Sensors, Actuators and Application 6. Micro and Nano Metrology, Macro Metrology 7. Laser Measurement Techniques and Instruments 8. Instrument and Measurement System Calibration 9. Measurement for MEMS and Micro/Nano 10. Micro and Nano Optics 11. Accuracy Theory and Uncertainty Analysis |